Dual-Die Programmable Linear Hall IC with Advanced Diagnostics for Safety-Critical Applications

A1346

These parts are in production but have been determined to be NOT FOR NEW DESIGN.

This classification indicates that sale of this device is currently restricted to existing customer applications. The device should not be purchased for new design applications because obsolescence in the near future is probable. Samples are no longer available. Date of status change: April 5, 2022.

We recommend the A31102 as a replacement part.

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Product Details

Top Features

Two electrically isolated die in one package for the most safety-critical applications
- In the event of a die failure, self-diagnostics allow the controller to discern which die to continue to trust
- For diagnostics that impact response, these diagnostics can be run on each die while the other is fully operational
- For all features below, these refer to each of the two die in the package
High-speed analog, A-to-D converter (ADC), and digital architectures, enabling user-selectable bandwidth for speed-sensitive applications
- 4-phase chopper stabilization, which minimizes offset drift across temperature range
- 16-bit, high update rate ADC
Exceptional stability throughout lifetime and across temperature changes
- Factory-configured using multisegment temperature compensation to give a flat baseline across operating temperature range
- Customer configurability for 1st and 2nd order sensitivity and 1st order offset compensation across temperature range
- Integrated feedback coil compensates for drift throughout product lifetime
Wide operating flexibility to meet any application:
- Field range from ±40 to ±1800 gauss
- Rail to negative rail offset configurability
- High-precision, full output range high and low clamps
- Integrated linearization allows for flexible output waveform translation and compensation for nonlinear magnetic inputs
Advanced diagnostic-focused features enabling easier systemlevel ASIL compliance
- Full data path validation through active front-end stimulation with internal magnetic coil; this method validates all relevant transistors for device operation
- Logic Built-In Self Test (LBIST) on-demand to validate the digital subsystem
- Large suite of configurable fault monitors provide system level fault detection, including:
  - Overvoltage or undervoltage
  - Overtemperature
  - Magnetic Field Out of Range detection
  - Broken wire detection
Flexible output protocols with up to 12-bit resolution and configurable error notifications
- Digital open-drain output allows for flexible output voltage levels
- PWM (Pulse-Width-Modulated) output with diagnostic output mode to identify fault conditions
- SENT (Single Edge Nibble Transmission) compliant output with configurable reporting of error conditions and other diagnostic information
- Proprietary Fast SENT provides increased data rates to support high-bandwidth applications
- Device-shared SENT protocol as SSENT (Sequential SENT) and ASENT (Addressable SENT) allows user to connect up to 4 devices on the same output line for faster communication.
- Enhanced EMC tuning through programmable fall-time configurability
Integrated EEPROM enables a high level of configurability and product traceability
- Customer-reserved area allows on-board storage of unique lot and date code information
- Robust EEPROM with Single Error Correction and Double Error Detection (SECDED), capability
- Integrated charge pump allows in-application programming without any requirement for high voltages to be supplied to the device during programming
Allegro Sensor Bias LDO